Malvern Panalytical Advanced Materials ads

Characterization requirements evolve as semiconductor processes move from research to production. The X'Pert³ MRD XL supports every stage of development, from research and process development to process control. One flexible platform for semiconductor single-crystal epitaxial structures and polycrystalline thin films. Fill in the form to see how X'Pert³ MRD XL can grow with your process.

Complex multilayers demand accurate characterization. The 2830 ZT combines advanced Fundamental Parameter modeling with simultaneous thickness and composition analysis, helping you characterize complex semiconductor structures with confidence. Fill in the form to discuss your metrology challenges with a 2830 ZT specialist.

High-resolution XRD and fast measurement times shouldn't be a trade-off. The X'Pert³ MRD XL combines high-resolution X-ray diffraction with high-intensity performance, enabling reliable characterization of semiconductor thin films and epitaxial layers in less time. Fill in the form and discover how X'Pert³ MRD XL can accelerate your characterization workflow.

Stable processes require stable metrology. With industry-leading long-term stability and minimal calibration maintenance, the 2830 ZT helps deliver consistent film thickness and composition measurements while maximizing instrument uptime. Fill in the form to learn how the 2830 ZT can support your process control strategy.

Thickness and composition data shouldn't require multiple measurements. The 2830 ZT Wafer Analyzer delivers simultaneous film thickness and elemental composition analysis with sub-angstrom precision. Get the accurate data you need to support semiconductor process development and control. Fill in the form to speak with a 2830 ZT specialist

Hidden strain and crystal defects can impact device performance long before they are detected. The X'Pert³ MRD XL delivers the high-resolution XRD insights needed to characterize layer thickness, strain, crystal quality, and composition with confidence. Fill in the form to speak with an X'Pert³ MRD XL specialist about your semiconductor characterization challenges.