Park Systems

Why choose an automated AFM for your lab? Make correlative electrical characterization simpler with Park FX AFMs. Switch between conductive AFM (C-AFM) and Kelvin probe force microscopy (KPFM) without manual hardware reconfiguration or losing your position on the sample. Reconfigure electrical pathways, measurement modes, channels, bias and tracking methods without touching the instrument. Watch the video to see seamless switching between KPFM and C-AFM on a cobalt-doped iron oxide thin film, connecting complementary electrical measurements at the same sample location. Explore more FX automation features and demo videos.

Why automation in research AFM? Imagine navigating between loaded samples without adjusting knobs or manually locating each measurement site. Park FX AFMs make it possible. Watch how a calibrated alignment camera above the motorized sample stage maps samples on the chuck and defines locations for automated measurements. 💡Map all samples loaded on the instrument 💡Mark stage coordinates for later automated measurements 💡Switch between samples remotely These features support multi-sample workflows and navigation on large substrates, including 200 mm wafers. Explore more FX automation features and demo videos.

Why automate advanced electrical measurements? By automating key setup steps, Park FX AFMs simplify surface potential and work function measurements, helping users complete heterodyne Kelvin probe force microscopy (HD-KPFM) setup in seconds. Watch the video to follow five simple steps: 1. Select HD-KPFM in the sample bias tab. 2. Run the automatic heterodyne frequency sweep. 3. Apply a voltage in the lock-in amplifier tab. 4. Select the KPFM channels. 5. Enable KPFM feedback. Explore more FX automation features and demo videos.

Why choose an automated AFM? Save time on probe loading, exchange and alignment with Park Systems’ FX series AFMs. Watch the video to see probe loading, QR code recognition, pickup, detection and alignment, all fully automated. 💡Switch between preloaded probes remotely during long automated experiments 💡Automatically identify probe types using QR codes 💡Focus on exploring the technique with less time spent on setup 💡Reduce the risk of user error during probe handling and alignment Explore more FX automation features and demo videos.

Why does automation matter in research AFM? Landing a probe safely from more than 10 mm above the surface can be a bottleneck in AFM operation. Watch how Park FX AFMs monitor cantilever dynamics during descent, allowing the probe to be lowered from several centimeters above the surface in seconds. Users do not need to enter sample height information, simplifying setup and reducing the risk of crashes caused by operator error. 💡Explore more FX automation features and demo videos.

What happens at electrode interfaces can determine how the entire battery performs. Discover how scanning electrochemical probe microscopies (SEPM) reveal local electrochemical processes such as interphase formation in emerging battery materials at the nanoscale.